Add uniform_integer_distribution

This commit is contained in:
Martin Hořeňovský
2023-12-08 22:01:36 +01:00
parent 04a829b0e1
commit ed9d672b5c
22 changed files with 624 additions and 18 deletions

View File

@@ -12,7 +12,9 @@
#include <catch2/internal/catch_random_number_generator.hpp>
#include <catch2/internal/catch_random_seed_generation.hpp>
#include <catch2/internal/catch_uniform_floating_point_distribution.hpp>
#include <catch2/internal/catch_uniform_integer_distribution.hpp>
#include <catch2/generators/catch_generators.hpp>
#include <catch2/matchers/catch_matchers_range_equals.hpp>
TEST_CASE("Our PCG implementation provides expected results for known seeds", "[rng]") {
Catch::SimplePcg32 rng;
@@ -104,3 +106,386 @@ TEST_CASE( "fillBitsFrom - shortening and stretching", "[rng][approvals]" ) {
REQUIRE( stretched == 0xccbe'5f04'a424'a486 );
}
}
TEST_CASE("uniform_integer_distribution can return the bounds", "[rng][distribution]") {
Catch::uniform_integer_distribution<int32_t> dist( -10, 10 );
REQUIRE( dist.a() == -10 );
REQUIRE( dist.b() == 10 );
}
namespace {
template <typename T>
static void CheckReturnValue(Catch::uniform_integer_distribution<T>& dist,
Catch::SimplePcg32& rng,
T target) {
REQUIRE( dist.a() == dist.b() );
for (int i = 0; i < 1'000; ++i) {
REQUIRE( dist( rng ) == target );
}
}
}
TEMPLATE_TEST_CASE( "uniform_integer_distribution can handle unit ranges",
"[rng][distribution][approvals]",
unsigned char,
signed char,
char,
uint8_t,
int8_t,
uint16_t,
int16_t,
uint32_t,
int32_t,
uint64_t,
int64_t ) {
// We want random seed to sample different parts of the rng state,
// the output is predetermined anyway
std::random_device rd;
auto seed = rd();
CAPTURE( seed );
Catch::SimplePcg32 pcg( seed );
// We check unitary ranges of 3 different values, min for type, max for type,
// some value inbetween just to make sure
SECTION("lowest value") {
constexpr auto lowest = std::numeric_limits<TestType>::min();
Catch::uniform_integer_distribution<TestType> dist( lowest, lowest );
CheckReturnValue( dist, pcg, lowest );
}
SECTION( "highest value" ) {
constexpr auto highest = std::numeric_limits<TestType>::max();
Catch::uniform_integer_distribution<TestType> dist( highest, highest );
CheckReturnValue( dist, pcg, highest );
}
SECTION( "some value" ) {
constexpr auto some = TestType( 42 );
Catch::uniform_integer_distribution<TestType> dist( some, some );
CheckReturnValue( dist, pcg, some );
}
}
// Bool needs its own test because it doesn't have a valid "third" value
TEST_CASE( "uniform_integer_distribution can handle boolean unit ranges",
"[rng][distribution][approvals]" ) {
// We want random seed to sample different parts of the rng state,
// the output is predetermined anyway
std::random_device rd;
auto seed = rd();
CAPTURE( seed );
Catch::SimplePcg32 pcg( seed );
// We check unitary ranges of 3 different values, min for type, max for
// type, some value inbetween just to make sure
SECTION( "lowest value" ) {
Catch::uniform_integer_distribution<bool> dist( false, false );
CheckReturnValue( dist, pcg, false );
}
SECTION( "highest value" ) {
Catch::uniform_integer_distribution<bool> dist( true, true );
CheckReturnValue( dist, pcg, true );
}
}
TEMPLATE_TEST_CASE( "uniform_integer_distribution can handle full width ranges",
"[rng][distribution][approvals]",
unsigned char,
signed char,
char,
uint8_t,
int8_t,
uint16_t,
int16_t,
uint32_t,
int32_t,
uint64_t,
int64_t ) {
// We want random seed to sample different parts of the rng state,
// the output is predetermined anyway
std::random_device rd;
auto seed = rd();
CAPTURE( seed );
Catch::SimplePcg32 pcg( seed );
constexpr auto lowest = std::numeric_limits<TestType>::min();
constexpr auto highest = std::numeric_limits<TestType>::max();
Catch::uniform_integer_distribution<TestType> dist( lowest, highest );
STATIC_REQUIRE( std::is_same<TestType, decltype( dist( pcg ) )>::value );
// We need to do bit operations on the results, so we will have to
// cast them to unsigned type.
using BitType = std::make_unsigned_t<TestType>;
BitType ORs = 0;
BitType ANDs = BitType(-1);
for (int i = 0; i < 100; ++i) {
auto bits = static_cast<BitType>( dist( pcg ) );
ORs |= bits;
ANDs &= bits;
}
// Assuming both our RNG and distribution are unbiased, asking for
// the full range should essentially give us random bit generator.
// Over long run, OR of all the generated values should have all
// bits set to 1, while AND should have all bits set to 0.
// The chance of this test failing for unbiased pipeline is
// 1 / 2**iters, which for 100 iterations is astronomical.
REQUIRE( ORs == BitType( -1 ) );
REQUIRE( ANDs == 0 );
}
namespace {
template <typename T>
struct uniform_integer_test_params;
template <>
struct uniform_integer_test_params<bool> {
static constexpr bool lowest = false;
static constexpr bool highest = true;
// This seems weird, but it is an artifact of the specific seed
static constexpr bool expected[] = { true,
true,
true,
true,
true,
true,
false,
true,
true,
true,
true,
true,
false,
true,
true };
};
template <>
struct uniform_integer_test_params<char> {
static constexpr char lowest = 32;
static constexpr char highest = 126;
static constexpr char expected[] = { 'k',
'\\',
'Z',
'X',
'`',
'Q',
';',
'o',
']',
'T',
'v',
'p',
':',
'S',
't' };
};
template <>
struct uniform_integer_test_params<uint8_t> {
static constexpr uint8_t lowest = 3;
static constexpr uint8_t highest = 123;
static constexpr uint8_t expected[] = { 'c',
'P',
'M',
'J',
'U',
'A',
'%',
'h',
'Q',
'F',
'q',
'i',
'$',
'E',
'o' };
};
template <>
struct uniform_integer_test_params<int8_t> {
static constexpr int8_t lowest = -27;
static constexpr int8_t highest = 73;
static constexpr int8_t expected[] = { '5',
'%',
'#',
' ',
'*',
25,
2,
'9',
'&',
29,
'A',
':',
1,
28,
'?' };
};
template <>
struct uniform_integer_test_params<uint16_t> {
static constexpr uint16_t lowest = 123;
static constexpr uint16_t highest = 33333;
static constexpr uint16_t expected[] = { 26684,
21417,
20658,
19791,
22896,
17433,
9806,
27948,
21767,
18588,
30556,
28244,
9439,
18293,
29949 };
};
template <>
struct uniform_integer_test_params<int16_t> {
static constexpr int16_t lowest = -17222;
static constexpr int16_t highest = 17222;
static constexpr int16_t expected[] = { 10326,
4863,
4076,
3177,
6397,
731,
-7179,
11637,
5226,
1929,
14342,
11944,
-7560,
1623,
13712 };
};
template <>
struct uniform_integer_test_params<uint32_t> {
static constexpr uint32_t lowest = 17222;
static constexpr uint32_t highest = 234234;
static constexpr uint32_t expected[] = { 190784,
156367,
151409,
145743,
166032,
130337,
80501,
199046,
158654,
137883,
216091,
200981,
78099,
135954,
212120 };
};
template <>
struct uniform_integer_test_params<int32_t> {
static constexpr int32_t lowest = -237272;
static constexpr int32_t highest = 234234;
static constexpr int32_t expected[] = { 139829,
65050,
54278,
41969,
86051,
8494,
-99785,
157781,
70021,
24890,
194815,
161985,
-105004,
20699,
186186 };
};
template <>
struct uniform_integer_test_params<uint64_t> {
static constexpr uint64_t lowest = 1234;
static constexpr uint64_t highest = 1234567890;
static constexpr uint64_t expected[] = { 987382749,
763380386,
846572137,
359990258,
804599765,
1131353566,
346324913,
1108760730,
1141693933,
856999148,
879390623,
1149485521,
900556586,
952385958,
807916408 };
};
template <>
struct uniform_integer_test_params<int64_t> {
static constexpr int64_t lowest = -1234567890;
static constexpr int64_t highest = 1234567890;
static constexpr int64_t expected[] = { 740197113,
292191940,
458575608,
-514589122,
374630781,
1028139036,
-541919840,
982953318,
1048819790,
479429651,
524212647,
1064402981,
566544615,
670203462,
381264073 };
};
// We need these definitions for C++14 and earlier, but
// GCC will complain about them in newer C++ standards
#if __cplusplus <= 201402L
constexpr bool uniform_integer_test_params<bool>::expected[];
constexpr char uniform_integer_test_params<char>::expected[];
constexpr uint8_t uniform_integer_test_params<uint8_t>::expected[];
constexpr int8_t uniform_integer_test_params<int8_t>::expected[];
constexpr uint16_t uniform_integer_test_params<uint16_t>::expected[];
constexpr int16_t uniform_integer_test_params<int16_t>::expected[];
constexpr uint32_t uniform_integer_test_params<uint32_t>::expected[];
constexpr int32_t uniform_integer_test_params<int32_t>::expected[];
constexpr uint64_t uniform_integer_test_params<uint64_t>::expected[];
constexpr int64_t uniform_integer_test_params<int64_t>::expected[];
#endif
}
TEMPLATE_TEST_CASE( "uniform_integer_distribution is reproducible",
"[rng][distribution][approvals]",
bool,
char,
uint8_t,
int8_t,
uint16_t,
int16_t,
uint32_t,
int32_t,
uint64_t,
int64_t) {
Catch::SimplePcg32 pcg( 0xaabb'ccdd );
constexpr auto lowest = uniform_integer_test_params<TestType>::lowest;
constexpr auto highest = uniform_integer_test_params<TestType>::highest;
Catch::uniform_integer_distribution<TestType> dist(lowest, highest);
constexpr auto iters = 15;
std::array<TestType, iters> generated;
for (int i = 0; i < iters; ++i) {
generated[i] = dist( pcg );
}
REQUIRE_THAT(generated, Catch::Matchers::RangeEquals(uniform_integer_test_params<TestType>::expected));
}